名称:
描述:
公开/私有: 公开 私有
标签: 用空格间隔多个标签,如:小说 文学 余秋雨
保存至书单:

IEEE design & test of computers /

ISBN/ISSN:
0740-7475
中图分类法 :
TP3
题名:
IEEE design & test of computers /
其它题名:
IEEE design and test of computers.
其它题名:
Design & test of computers.
其它题名:
Design and test of computers.
其它题名:
IEEE design and test.
其它题名:
IEEE design & test.
出版发行:
Los Alamitos, CA : IEEE Computer Society, c1984-
附注:
Title from cover.
主题词:
Computer engineering Periodicals.
主题词:
Electronic digital computers Testing Periodicals.
标签:
相关资源:
限定所在馆: 限定所在馆藏地点: 限定馆藏状态:   预借:可预借在馆图书 >>
HEA|  |02440cas  2200601   4504
001|  |112000000117
003|  |DLC
005|  |20030825082108.0
008|  |831017c19849999cauqr1p       0   a0eng d
010|  |▼a91641150 ▼zsn 83002868
022|0 |▼a0740-7475
032|  |▼a732250▼bUSPS
035|  |▼a(OCoLC)10024072
042|  |▼ansdp▼alc
050|00|▼aTK7885.A1▼bI174
093|  |▼aTP3
098|  |▼a730B0001DT▼bW2031
098|  |▼aW231
210|0 |▼aIEEE des. test comput.
212|0 |▼aInstitute of Electrical and -
   |  |Electronics Engineers design &-
   |  | test of computers.
222| 0|▼aIEEE design & test of computers.
245|00|▼aIEEE design & test of comput-
   |  |ers /▼cIEEE Computer Society [-
   |  |and] the Institute of Electric-
   |  |al and Electronics Engineers, Inc.
246|10|▼aIEEE design and test of computers.
246|10|▼aDesign & test of computers.
246|10|▼aDesign and test of computers.
246|10|▼aIEEE design and test.
246|17|▼aIEEE design & test.
260|  |▼aLos Alamitos, CA :▼bIEEE Com-
   |  |puter Society,▼cc1984-
265|  |▼aIEEE Computer Society, PO Bo-
   |  |x 3014, Los Alamitos, CA 90720-1264.
310|  |▼aQuarterly,▼bMar. 1991-
321|  |▼aQuarterly,▼bFeb. 1984-
321|  |▼aBimonthly,▼b<Oct. 1987>-Dec. 1990.
350|  |▼a$22.00.
362|0 |▼aVol. 1, no. 1 (Feb. 1984)-
500|  |▼aTitle from cover.
510|1 |▼aIndex to IEEE publications▼x0099-1368.
510|2 |▼aElectronics and communicatio-
   |  |ns abstracts journal (Riverdal-
   |  |e)▼x0361-3313.
510|2 |▼aInternational aerospace abst-
   |  |racts▼x0020-5842▼b1984-
510|2 |▼aISMEC bulletin▼x0306-0039.
510|2 |▼aPollution abstracts with ind-
   |  |exes▼x0032-3624.
510|2 |▼aSafety science abstracts jou-
   |  |rnal▼x0160-1342.
515|  |▼aVol. 1, no. 1 also called pr-
   |  |emiere issue.
530|  |▼aAvailable also on microfilm -
   |  |and microfiche from the Instit-
   |  |ute of Electrical and Electron-
   |  |ics Engineers.
590|  |▼aOriginal Journal.
650| 0|▼aComputer engineering▼xPeriodicals.
650| 0|▼aElectronic digital computers-
   |  |▼xTesting▼xPeriodicals.
710|20|▼aIEEE Computer Society.
710|20|▼aInstitute of Electrical and -
   |  |Electronics Engineers.
776|1 |▼tIEEE design & test of comput-
   |  |ers▼w(OCoLC)13246898.
776|1 |▼tIEEE design & test of comput-
   |  |ers▼w(DLC)sn 85019938▼w(OCoLC)10596192.
990|  |▼t2003购权重印外文刊/▼ngqwk0301/▼p▼o000061
999|  |▼tC▼Zlclw▼z20030811 18:11:19▼M-
   |  |ltw2w▼m20030825 08:21:08
000|  |1900000055