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保存至书单:
Microelectronics Reliability : An International Journal & World Abstracting Service |
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ISBN/ISSN:
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0026-2714 |
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语种:
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eng |
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中图分类法
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TN4/148 |
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题名:
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Microelectronics Reliability [An International Journal & World Abstracting Service] |
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其它题名:
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Microelectronics and Reliability |
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出版发行:
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Oxford : Pergamon Press, 1964- |
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附注:
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Continues: Electronics Reliability & Microminiaturization |
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附注:
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Continues:Microelectronics and ReliabilityV.3,no.1(June 1964)--v.37,no.12(1997) |
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